Dielectric properties characterization of high dielectric constant thick films
Por:
Demenicis, Luciene S., J. I. Marulanda, Lima, Rodolfo A. A., Carvalho, Maria Cristina R.
Publicada:
1 oct 2010
Resumen:
A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar
waveguide transmission lines with high dielectric constant thick films deposit
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